Power Efficiency

Ensure safe, precise and fast Si, SiC and GaN MOSFET testing in a lab and a wafer test environment. Learn more about the testing challenges resulting from the adoption of SiC and GaN into your designs and how to solve them. Discover how to minimize power draw and maximize battery life for your end-products. Accelerate the time-to-market for your designs.

Power Device Characterization

  • Safe, Precise, Fast MOSFET Testing for Si, SiC and GaN devices
  • Wide power envelope
  • Safely set up your test
  • 2X Faster Device Characterization for improved time to market
  • Avoid expensive overdesigning of your wide bandgap device

Automated Parametric Test

  • Fully-automated HV Wafer-level testing
  • Move from high voltage to low voltage without changing test setup
  • Measure capacitance without manual reconfiguration Fast automation

Faster Time to Market for your Power Conversion Designs

  • Overcome high common mode voltages
  • Simultaneously measure multiple control and timing signals
  • Faster automated power measurements
  • Don't fail compliance

Maximizing Battery Life of IoT Devices

  • Determine the load current profile
  • Simulate any battery
  • Model any type of battery

Trends in Power Efficiency

Our engineers share their views on why power efficiency has become a more critical design consideration than ever before.

"So this year we saw a giant inflection point with silicon carbide where there’s a lot of commercial products."

Tom Neville, Tektronix

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