High Speed Serial Communications
High-speed digital standards are quickly evolving to support the performance demands of our data driven world. Next generation serial standards and data communication requirements are bringing new test challenges, pushing the limits of today’s compliance and debug tools. From design and simulation, analysis, debug, and compliance testing, Tektronix provides advanced, automated measurement solutions to optimize performance, speed up validation cycles and accelerate time-to-market.
- SERIAL STANDARDS
- PCI Express (PCIe)
- DATA COMMUNICATIONS TECHNOLOGIES
- 100G Optical and Electrical TX/RX Testing
- 400G PAM4 Testing
- Coherent Optical
Accelerate PCIe, SAS, SATA Test and Debug
Keeping pace with the next generation of data rates and storage standards requires end-to-end solutions that can scale to 32Gb/s while providing current-gen capabilities.
Discover how to accelerate your design testing and debug.
Consumer Standards over Type-C
The Type-C connector provides consolidation of consumer standards USB 3.1, DisplayPort 1.4, and Thunderbolt. This translates to new design challenges making it difficult to keep design costs low while maintaining optimal electrical margins on your products.
Discover how to tackle these new challenges.
e-Guide to High Speed Interface Standards
This FREE e-Guide will help you learn more about design challenges for testing PCIe 4.0, SAS, SuperSpeed USB, and DDR4 standards. You get quick access to technical resources that will help you understand design challenges and pick the right solution for your test needs.
|PCI Express® Transmitter PLL Testing — A Comparison of Methods|
Overview of significant methods for performing PLL Testing
|Probing Tips for High Performance Design and Measurement|
Learn how to identify common signal integrity problems experienced in high speed and mobile designs, modeling techniques used to study and de-embed the effects of probing, probing considerations for low power circuits and much more in this detailed application note for high performance designs.
|High Speed Interface Standards|
This e-Guide will help you learn more about design challenges for testing PCIe 4.0, SAS, SuperSpeed USB, and DDR4 standards. Within the pages of the eGuide you will also get quick access to technical resources that will help you understand design challenges and pick the right solution for your test needs.
|Remote Head Acquisition Improves High Speed Serial Measurement|
Learn how to maximize the margin in your signal integrity measurements.
|Fast+ Efficient Solutions for DVI Conformance Measurement Challenges |
Tektronix provides all the DVI measurement solutions you need, ranging from high-bandwidth digital phosphor oscilloscopes (DPO) to probes to application-specific software. Tektronix has solved tough measurement problems like jitter and eye diagram tests to assemble a DVI solution that automates and simplifies your work.
|Characterizing an SFP+ Transceiver at the 16G Fibre Channel Rate|
Measurements needed to test an SFP+ transceiver to the 16G Fibre Channel standard.
|Demystify MIPI D-PHY and C-PHY Transmitter and Receiver Physical Layer Test|
During this webinar, you'll gain an understanding of MIPI test challenges for both MIPI high-speed physical layers and useful tips and technical insights into characterizing and validating design compliance.
|How to Address Your Toughest Serial Bus Design Challenges with EDA and Measurement Correlation|
This Tektronix webinar will teach engineers how to use modeling tools to correlate simulations with high-speed physical layer measurements on Serial Bus Standards using the DPO/MSO70000 Series Oscilloscopes.