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DC I-V Testing for Components and Semiconductor Devices


DC I-V measurements are the cornerstone of device and material testing. This DC I-V testing applications e-guide features a concentration of application notes on DC I-V testing methods and techniques using Keithley’s Model 4200-SCS Parameter Analyzer. The Model 4200-SCS provides a wide range of I-V measurements including sub-pA leakage measurements and µΩ resistance measurements.