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Tag: #FAILURE ANALYSIS

Posts

Keithley’s 2601B-PULSE System SourceMeter product image
Speeding up Failure Analysis using Lock-in Thermography Thursday, February 4, 2021
Semiconductor companies and semiconductor researchers are constantly looking for ways to make devices fail in the lab in order to prevent failures in the field. Countless hours are spent by failure analysis (FA) engineers trying to understand why a device failed and how it can be prevented in the future. This is vital as many devices are used in mission critical applications where “failure is not …
They’re Back: New Software for Keithley SMUs Emulates Classic Tektronix Curve Tracers Saturday, December 7, 2019

Tektronix introduced the industry’s first curve tracer in 1955 to display characteristic curves for vacuum tubes, followed over the years by models for testing transistors, diodes and other solid-state devices. Tektronix curve tracers such as the 576 (below) and 370A/370B went on to broad industry acceptance until production eventually stopped in the mid-eighties. Approximating a power supply and an oscilloscope packaged in the same box, curve tracers source voltage while plotting voltage vs. current.