If you’re developing the materials or devices of the future like silicon-based compound semiconductors, thin film for solar cells, graphene and other nanoscale materials, etc., you’re at the fore-front of breakthroughs in new applications in semiconductor technology, electronics, medical devices, health care, and more. Let us show you the latest innovations and techniques for accurate electrical characterization of these advanced materials, including:
- Electrochemistry Characterization
- Measurement of Nanoscale Materials
- Hall Effect Test of Graphene Device Structures
- Pulsed I-V Testing of Compound Semi Devices/Materials
- Focused Ion Beam Current Monitoring
- Characterization of Nanocrystals
- C-V Characterization of Solar Cells
- Semiconductor Parameter Analysis
- Ultra-Low Current Measurements
Our comprehensive solutions for electrical characterizations of new materials and devices can help you invent deeper and reimagine our world.
Featured Content
Materials E-Guide
Learn the techniques that will ensure the highest degree of electrical measurement accuracy. Get your Free eGuide on Exploring Electrical Characterization of New Materials and Devices today.
Keithley Instrumentation for Electrochemical Test Methods and Applications
This primer discusses electrochemical applications in which Keithley’s sensitive measurement equipment is being used, including voltammetry, low and high resistivity measurements, battery test, potentiometry, electrodeposition, and electrical device characterization.
Resistivity Measurements Using the Model 2450 SourceMeter SMU Instrument and a Four-Point Collinear Probe
To simplify measurements, a single instrument, the Model 2450 SourceMeter® Source Measure Unit (SMU) Instrument, can be used.
Recommended Equipment
SMU 2400 Graphical SourceMeter
Potentiostats
4200-SCS Parameter Analyzer
Library
| Title | |
|---|---|
| Tips and Techniques to Simplify MOSFET/MOSCAP Device Characterization | This webinar presents a new process that makes characterization and parameter extraction easier and quicker. We'll be discussing the extraction of common parameters as well as which tests to run to get the most information about your device. |
