100G Optical and Electrical Tx/Rx

Tektronix provides comprehensive Tx & Rx testing support for 100G standards along with testing guidance for both NRZ and PAM4 signaling as well as Complex Coherent Modulation formats. Tektronix Test Instrumentation will get your team ready to tackle the next wave of datacom technologies.

  • DPO70000SX Series Real Time Oscilloscopes offer the ability to efficiently prove-out your technology advances and rapidly de-bug and validate 100G electrical technology standards. Clarify your 100G design's performance with an industry-low noise floor and high sample rate.
    • NEW! With the DPO7OE1 Optical Probe for the MSO/DPO70000 scopes you can easily troubleshoot your optical devices by adding powerful debug capabilities: software clock recovery for PAM4 and NRZ, triggering, error detection, and capture time correlated or contiguous acquisition of a signal.
  • DSA8300 Series Sampling Oscilloscopes are suitable for accurate characterization of optical transmitter performance for major single-mode optical standards using industry leading built-in optical reference receivers with very low OSNR.
    • NEW! The 80C17 and 80C18 Optical Modules for the DSA8300 provide the industry's highest mask test sensitivity and lowest optical noise along with new features that increase production capacity and improve yield for current 100G designs moving into production.
  • CR286A Clock recovery instruments support most 100Gbp/s standards and work in concert with the Tektronix Sampling Scopes and BERT’s to deliver a stable clock for accurate timing measurement analysis.
  • BERTScope BSA Series Bit Error Rate Testers provide long pattern generation of PRBS signals along with very accurate BER measurement results and deep, root-cause analysis.

 

Featured Content

Library

Title
100G/400G Datacom Transmitter Measurements: Determining Proper Measurement Tools for 100G/400G Datacom Testing

This application note walks through a number of common misconceptions and key considerations to help you select the proper scope technology (RTO vs. ETO) for your needs.

Extinction Ratio (ER) Calibrated White Paper

This white paper explains some of the benefits of highly accurate ER measurements in both 10 GbE (Ethernet), with its relatively low ER requirement, and in SONET/SDH, and the methodology that supports consistent, accurate ER result.

Physical Layer Tests of 100 Gb/s Communications Systems

Learn how to prepare for compliance measurements on 100G standards.

Bridging the Gap Between BER and Eye Diagrams — A BER Contour Tutorial

Introduction to the BER Contour measurement.

Clock Recovery Primer, Part 1

Look at clock recovery from a practical point of view, Part 1.

PAM4 Signaling in High Speed Serial Technology: Test, Analysis, and Debug

Learn valuable information on testing PAM4 technology and approaches for validating PAM4 signals.  This application note describes:

  • PAM4 technology for 50-400G applications
  • Provides details of PAM4 signaling
  • Outlines important aspects of evaluating electrical and optical transmitters
  • And explains methods for evaluating PAM4 receivers and more
32 Gbit/s QPSK Transmission at 385 GHzLearn more about a world record breaking wireless system capable of transmitting data at 400 GHz (0.4 THz) using advanced signal coding (up to QAM-16) and key advanced THz devices in this whitepaper.
Semtech Turns to Tektronix DSA8300 Sampling Scope to Characterize New 25-28 Gb/s CDR DevicesThis customer case study illustrates the benefits that Tektronix DataCom test solutions deliver to characterize electrical performance of 100G technologies with the industry’s lowest intrinsic noise floor.
Practices for Measurements on 25 Gb/s Signaling

Review of the measurement practices for the characterization and compliance test of the transmitter and receiver for 25+ Gb/s signaling in 100 G systems with oscilloscopes.

Coherent Optical Signal Generation with High-Performance AWG

Learn how instrument characteristics and performance level of the AWG70000 influence the ability to generate different modulation schemes and the way the instrument’s flexibility can be used to compensate for internal and external device imperfections and to emulate component and link distortions.

See the versatility of our high-speed optical-to-electrical converters (DPO7OE1…

3:40
Observe as Tektronix Dr. Klaus Engenhardt demonstrates how to conduct PAM-4 Signal…
2:30

This video highlights the benefits of using the DPO70000SX real time oscilloscope…

4:02

View this demonstration of interoperability at OFC2013 using Tektronix…

4:55

Find out how new PAM4 software updates including full noise decomposition enable…

5:15
See how to conduct PAM-4 Analysis using PPG3204 Pattern Generator and DSA8300…
2:05

Watch our highlights overview of OFC 2017! 

1:42
See how the DSA8300 Series Sampling Oscilloscope can perform data eye diagram and…
5:29

At this ECOC 2016 Demo Station, we're looking at generating a 50+ Gigabaud…

2:49
See how Tektronix is supporting industry adoption of 28Gb/s interconnect with OIF…
6:16
Title
PAM4 Electrical Webinar

This presentation will review PAM4 measurement methodologies and expand on emerging needs related to FFE reference equalization, clock recovery challenges, BER measurement needs as well as SNDR as it relates to multi-level signaling. 

NBASE-T and IEEE802.3bz Technology and Measurements

The rapid growth of ever-more powerful mobile devices, and the adoption of new wireless technologies such as 802.11ac, has enterprise networks struggling to keep pace. An overview of NBASE-T and the emerging IEEE802.3bz standard, as well as key measurement challenges, will be presented in this webinar.

New Technologies for Probing Low Power Circuits Webinar

As designs for mobile devices and computers use lower power circuits in their design, validation testing and debug become more challenging.

Characterizing Coherent Optical Systems Webinar

Learn about the coherent modulation being considered for 400G networks, the key building blocks of a coherent test system, how to optimize measurement accuracy and the benefits of customizable analysis for non-standard testing.

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