Tektronix USB Tx and Rx software solutions meet the electrical validation, compliance, characterization and debug needs of engineers designing USB 3.1 Type-C, USB 3.1, and USB 2.0 based systems, which are compliant to the USB-IF test standards. A solution for USB-PD electrical parametric and protocol measurements for compliance is also available.

NEW! Automated USB 3.1 Type-C Test Solution

  • Quickly find the root cause of issues when testing SuperSpeed USB 3.1 Type-C designs with the combination of full SigTest support and DPOJET. USB 3.1 Software datasheet »

Transmitter & Receiver Testing with Tektronix Oscilloscopes and BERTs 

  • NEW! BSX Series BERTScope supports Gen [email protected]/s and Gen [email protected]/s integrated DPP and protocol aware architecture. 
  • Perform protocol analysis in conjunction with electrical validation using serial pattern trigger on MSO/DPO70000 DX Series Oscilloscopes
  • Get the most accurate characterization and margin analysis accomplished using the industry's lowest noise DPO70000SX Series Oscilloscopes.

Solutions for USB 3.1 Type-C, USB 3.1, and USB 2.0 based systems.

Discover more about our solutions for USB 3.1 Type-C, USB 3.1, and USB 2.0 based systems.

 

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