Event Description Application Location Opening Datesort icon
Fundamentals of Jitter Analysis Webinar

During this On Demand webinar the attendee will learn the fundamentals of jitter, sources of jitter and jitter analysis. We will explore in depth the toolset used to break jitter down into its fundamental building blocks to understand the root causes and the impact on the BER performance of a design.

Learn how to make accurate jitter measurements first time. Every time.

Location: Webinar

Date: On Demand


23 Nov 2016
High Speed Serial Data Probing Webinar

On Demand Webinar - Learn the fundamentals of how a scope probe works and the ‘probe loading’ effect. The webinar will focus on the particular probe designs and considerations for high speed serial data applications.

Location: Webinar

Date: On Demand


24 Nov 2016
Foundations of Radar Webinar

This On Demand Webinar focuses on the challenges related to the adoption of wideband radar and techniques to master them. Attendees will learn how to identify performance criteria for test instrumentation that allow you to create high fidelity simulation environments.

Location: Webinar

Date: On Demand


6 Dec 2016
Interference in Wireless Networks Webinar

Join us on this live webinar to learn more about interference hunting. Understanding what kinds of interference is out there, what it looks like and how to measure it will help you characterize and ultimately locate sources of interference.

Location: Webinar

Date: On Demand

14 Dec 2016
Tips and Techniques to Simplify MOSFET/MOSCAP Device Characterization
Today's semiconductor devices typically require an array of both current-voltage (I-V) and capacitance-voltage (C-V) tests to perform full parametric characterization of the device.
Though it's very common to perform these I-V and C-V tests on the same device, the two test types require different test equipment and cabling, presenting a difficult and time-consuming process that typically requires re-cabling the entire system.
This webinar presents a new technique that makes characterization and parameter extraction easier and quicker. We'll discuss parameter extraction and which tests will give you the most information about your device.
Learn how to:
Characterize both AC and DC properties of a MOS device
Perform I-V and C-V measurements correctly the first time
Switch between DC and AC measurements quickly and easily:
Location: Webinar
Date: 15th February 2017 15;00hrs GMT
We'll close the webinar with a live Q&A session, your opportunity to pose questions directly to our team of experts.
15 Feb 2017
Real Time RF Recording & Analysis Webinar
During this live webinar our expert, Robin Jackman, will discuss the following topics:
• Real time RF reording methods
• Computing / Storage performance considerations
• Offline signal analysis
• Real time signal generation
Location: Webinar
Date: 22nd February 2017 15:00hrs GMT
We'll close the webinar with a live Q&A session, your opportunity to pose questions directly to our team of experts.


22 Feb 2017
30th International Conference on Microelectronic Test Structure (ICMTS 2017)

Conference 27-30 March - Grenoble

To register click here

Discuss recent developments and future directions of tests structures design modeling and characterization and learn more about how Tektronix can help you.

Please come and see us there!

Grenoble, Rhône
27 Mar 2017
Fotonica 2017

National Conference on Photonic Technologies, 3-5 May - Padova, Italy


Please come and see us to learn more about our test and measurement solutions!

Padova, Agrigento
3 May 2017
JNM - Journées Nationales Micro-Ondes 2017

Conference, 16-19 May - St Malo


Please come and see our solutions in RF, Microwave, Wireless, EMI and Optics.

We look forward to your visit!

St. Malo, Ain
16 May 2017
IBC 2017

Exhibition 15 – 19 Sept 2017 – RAI Amsterdam

Tek Stand:  10 D41


Explore all the latest technologies and learn more about our products.  Come and see us at Stand 10 D41.

We look forward to seeing you there!

Amsterdam, Netherlands, 15 Sep 2017